LS 13 320 XR Particle Size Analyzer

Beckman Coulter LS13320XR Multi-Wavelength Particle Size Analyzer plus advanced Polarization Intensity Differential Scattering (PIDS) technology enable high-resolution measurement & reporting of real data down to 10 nm and up to 3,500 µm. With full implementation of both Fraunhofer and Mie Theories and analysis of vertical and horizontal polarized light at six different angles using three additional 475, 613, 750 and 900 nm wavelengths improves the accurate characterization of the smallest component submicron particles will not missed. ADAPT Software features simplifies method creation for standardized measurements thus automatically highlights pass/fail results for faster quality control.

Features: 

• Laser Diffraction Plus Advanced PIDS.
• High-Resolution Measurement To Spot Small Differences.
• Easy-To-Use ADAPT Software.
• Software 21 CFR Part 11 Ready.